The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 22, 2018

Filed:

Dec. 03, 2013
Applicant:

Hitachi High-technologies Corporation, Tokyo, JP;

Inventors:

Yoshihiro Yamashita, Tokyo, JP;

Takaaki Hagiwara, Tokyo, JP;

Toshiharu Suzuki, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G01N 35/00 (2006.01); G01N 35/10 (2006.01);
U.S. Cl.
CPC ...
G01N 35/00722 (2013.01); G01N 35/0098 (2013.01); G01N 35/1004 (2013.01); G01N 2035/00891 (2013.01);
Abstract

It is determined whether an automatic analysis device is in a state where it is necessary to perform periodic cleaning or periodic replacement on a B/F separation passage of a reaction liquid suction nozzlefor B/F separation or the like and a detection passage of a reaction liquid suction nozzlefor detection, a detection unit, and the like, based on the properties of a specimen, a reagent, and a reaction liquid which is obtained by reacting the specimen and the reagent, an analysis protocol which defines treatment conditions of these solutions, and the number of times of dispensing, feeding, and measuring the solutions; and the determined result is displayed on a displayas a signal. Accordingly, the automatic analysis device is provided so as to be able to perform adequate maintenance in accordance with analysis conditions.


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