The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 15, 2018
Filed:
Aug. 29, 2016
Applicant:
Mitutoyo Corporation, Kawasaki, Kanagawa, JP;
Inventor:
Masaki Kurihara, Kawasaki, JP;
Assignee:
MITUTOYO CORPORATION, Kawasaki, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06T 7/11 (2017.01); G06T 7/12 (2017.01); G06T 7/62 (2017.01);
U.S. Cl.
CPC ...
G06T 7/11 (2017.01); G06T 7/12 (2017.01); G06T 7/62 (2017.01); G06T 2207/30164 (2013.01);
Abstract
An image measuring apparatus according to an embodiment of the present invention comprises: an imaging device that images a workpiece to acquire an image of this workpiece; and a processing device that performs measurement of the workpiece based on this image and outputs a measurement result. Moreover, the processing device, based on the above-described image, generates another image whose number-of-pixels is smaller than that of the image, sets a plurality of regions based on this another image, and calculates the above-described measurement result based on these plurality of regions.