The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 15, 2018
Filed:
Mar. 12, 2015
Hitachi High-technologies Corporation, Minato-ku, Tokyo, JP;
Michiru Fujioka, Tokyo, JP;
Shuhei Yamamoto, Tokyo, JP;
Tsuyoshi Sonehara, Tokyo, JP;
Hiromi Kusaka, Tokyo, JP;
Akimasa Osaka, Tokyo, JP;
Hitachi High-Technologies Corporation, Tokyo, JP;
Abstract
In the microscope observation container according to the present invention, an observed sample is accommodated by an objective lens barrel provided with a housing extending along the radiation direction of excitation light and an objective lens fixed to an inside surface of the housing. The microscope observation container is provided with a structure for collecting a liquid immersion medium added by dispensation, the structure having a portion contacted by the objective lens barrel during observation. During observation the aforementioned portion is contacted by the objective lens barrel, and the liquid immersion medium is thereby sealed by the objective lens barrel and the structure. The aforementioned portion also has an elastic force, and is deformed so as to conform to the housing of the objective lens by the contact.