The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 15, 2018
Filed:
Feb. 13, 2014
Bruker Nano Gmbh, Berlin, DE;
Thomas Baumann, Münster, DE;
Ulrich Waldschläger, Berlin, DE;
BRUKER NANO GMBH, Berlin, DE;
Abstract
The invention relates to a device () for the spatial alignment of X-ray optics () with an entry point () and an exit point (). The device () comprises a parallel displacement mechanism () for gauging the entry point () of the X-ray optics () to a first predetermined point () by parallel displacement of the X-ray optics (). Further, the device () comprises a goniometer mechanism () for gauging the exit point () of the X-ray optics () to a second predetermined point () by at least approximate pivoting of the X-ray optics () around the entry point (). Further, the invention relates to an apparatus () which comprises the device () and X-ray optics ().