The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 15, 2018
Filed:
Dec. 19, 2013
Hitachi High-technologies Corporation, Tokyo, JP;
Koshi Maeda, Tokyo, JP;
Hiroko Fujita, Tokyo, JP;
Yoshiyuki Shoji, Tokyo, JP;
Ryoji Inaba, Tokyo, JP;
Hitachi High-Technologies Corporation, Tokyo, JP;
Abstract
In the past, genetic testing systems for exclusive use were needed due to the difference in type or property of specimens. Therefore, a genetic testing system includes: an extraction unit; an assay preparation unit; a reading unit; a first conveying mechanism for conveying a sample among the extraction unit, the assay preparation unit, and the reading unit; multiple sample loading units which are provided corresponding to at least two units of the extraction unit, the assay preparation unit, and the reading unit; and multiple second conveying mechanisms which are provided corresponding to the multiple sample loading units and convey test samples to the inside of the system from the sample loading units.