The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 15, 2018
Filed:
Jun. 24, 2016
Mitutoyo Corporation, Kanagawa-ken, JP;
Scott Ellis Hemmings, Edmonds, WA (US);
Andrew Patzwald, Kirkland, WA (US);
Mitutoyo Corporation, Kanagawa-ken, JP;
Abstract
A method is disclosed for operating a coordinate measuring machine (CMM) including a CMM control system, a surface scanning probe that measures a workpiece surface by outputting probe workpiece measurements, and a probe measurement timing subsystem. The method comprises: operating the CMM control system to output a measurement synchronization trigger signal at predictable times; operating the probe measurement timing subsystem to determine a pre-trigger lead time that is a fraction of a current duration of a probe workpiece measurement sample period, to initiate a current instance of the probe measurement sample period at the pre-trigger lead time before a next predictable time of the measurement synchronization trigger signal; operating the CMM control system to latch a current set of CMM position coordinate values; and operating the surface scanning probe to output the current instance of the probe workpiece measurement in association with the current set of CMM position coordinate values.