The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 08, 2018

Filed:

Nov. 12, 2015
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Sayuri Hada, Tokyo, JP;

Hiroyuki Mori, Shiga-ken, JP;

Keishi Okamoto, Kawasaki, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H05K 1/02 (2006.01); H05K 1/03 (2006.01); H05K 3/00 (2006.01); H05K 3/22 (2006.01); G01B 21/08 (2006.01); G01B 21/20 (2006.01);
U.S. Cl.
CPC ...
H05K 1/0271 (2013.01); G01B 21/08 (2013.01); G01B 21/20 (2013.01); H05K 1/0298 (2013.01); H05K 1/0313 (2013.01); H05K 3/0011 (2013.01); H05K 3/225 (2013.01); H05K 2201/09136 (2013.01); H05K 2203/013 (2013.01); H05K 2203/163 (2013.01);
Abstract

A method for reducing warpage on an organic substrate. The method includes: preparing an organic substrate, which includes (i) a core layer having an organic material, (ii) a first buildup layer on a front surface of the core layer, and (iii) a second buildup layer on a back surface of the core layer, measuring warpage of the organic substrate, calculating a thickness of a correction layer for reducing the warpage using properties of constituent materials including the coefficient of thermal expansion (CTE) and the Young's modulus of the core layer, and CTEs and the Young's modulus of the first and the second buildup layers, and forming at least one correction layer having the thickness on at least one part of surfaces of the first buildup layer and the second buildup layer. A system and an organic substrate is also provided.


Find Patent Forward Citations

Loading…