The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 08, 2018

Filed:

Aug. 08, 2016
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, Gyeonggi-do, KR;

Inventors:

Mun-Hyeon Kim, Seoul, KR;

Chang-Woo Noh, Hwaseong-si, KR;

Keun-Hwi Cho, Seoul, KR;

Myung-Gil Kang, Suwon-si, KR;

Shigenobu Maeda, Seongnam-si, KR;

Assignee:

SAMSUNG ELECTRONICS CO., LTD., Suwon-si, Gyeonggi-Do, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 27/092 (2006.01); H01L 29/49 (2006.01); H01L 29/51 (2006.01); H01L 21/8238 (2006.01); H01L 27/02 (2006.01);
U.S. Cl.
CPC ...
H01L 27/0924 (2013.01); H01L 27/092 (2013.01); H01L 21/823821 (2013.01); H01L 21/823828 (2013.01); H01L 21/823842 (2013.01); H01L 21/823871 (2013.01); H01L 21/823878 (2013.01); H01L 27/0207 (2013.01); H01L 29/49 (2013.01); H01L 29/51 (2013.01);
Abstract

Disclosed are CMOS device and CMOS inverter. The CMOS device includes a substrate having active lines extending in a first direction and defined by a device isolation layer, the substrate being divided into an NMOS area, a PMOS area and a boundary area interposed between the NMOS and the PMOS areas and having the device isolation layer without the active line, a gate line extending in a second direction across the active lines and having a first gate structure on the active line in the first area, a second gate structure on the active line in the second and a third gate structure on the device isolation layer in the third area. The electrical resistance and parasitic capacitance of the third gate structure are smaller than those of the NMOS and the PMOS gate structures. Accordingly, better AC and DC performance of the CMOS device can be obtained.


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