The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 08, 2018

Filed:

Apr. 25, 2016
Applicant:

United Microelectronics Corp., Hsin-Chu, TW;

Inventors:

Yu-Ying Lin, Tainan, TW;

Chueh-Yang Liu, Tainan, TW;

Yu-Ren Wang, Tainan, TW;

Chun-Wei Yu, Tainan, TW;

Kuang-Hsiu Chen, Tainan, TW;

Yi-Liang Ye, Kaohsiung, TW;

Hsu Ting, Tainan, TW;

Neng-Hui Yang, Hsinchu, TW;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 21/02 (2006.01); H01L 21/268 (2006.01); H01L 21/67 (2006.01); H01L 21/265 (2006.01); H01L 21/3065 (2006.01); H01L 21/306 (2006.01); H01L 21/687 (2006.01); H01L 29/66 (2006.01);
U.S. Cl.
CPC ...
H01L 21/2686 (2013.01); H01L 21/02057 (2013.01); H01L 21/26513 (2013.01); H01L 21/3065 (2013.01); H01L 21/30604 (2013.01); H01L 21/6708 (2013.01); H01L 21/67051 (2013.01); H01L 21/67115 (2013.01); H01L 21/68785 (2013.01); H01L 29/66575 (2013.01);
Abstract

An apparatus for semiconductor wafer treatment includes a wafer holding unit configured to receive a single wafer, at least a solution supply unit configured to apply a solution onto the wafer and an irradiation unit configured to emit irradiation to the wafer. The irradiation unit further includes at least a plurality of first light sources configured to emit irradiation in FIR range and a plurality of second light sources configured to emit irradiation in UV range.


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