The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 01, 2018
Filed:
Nov. 25, 2013
Freescale Semiconductor, Inc., Austin, TX (US);
Steven McLaughlin, Dumbarton, GB;
Alan Devine, Paisley, GB;
Alistair James Gorman, Broughty Ferry/Dundee, GB;
Alistair Paul Roberston, Glasgow, GB;
NXP USA, Inc., Austin, TX (US);
Abstract
A data processing device, comprising a processing unit and a test control unit connected to the processing unit, is described. The processing unit and the test control unit are arranged to: start a logic test of the processing unit; detect a test abort event; and, in response to the test abort event, perform an event response action which comprises aborting the logic test and booting the processing unit, said booting including executing an event handling routine. The event response action may comprise setting a reset vector to an address of the event handling routine. System availability may thus be improved. In particular, the delay between capturing an asynchronous signal and responding to it may be reduced. The test abort event may, for example, be an asynchronous event having certain pre-defined characteristics. A method of operating a data processing device is also described.