The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 01, 2018
Filed:
Feb. 04, 2015
Applicant:
Sandisk Technologies Llc, Plano, TX (US);
Inventors:
Niles Yang, Mountain View, CA (US);
Jianmin Huang, San Carlos, CA (US);
Swati Bakshi, Dublin, CA (US);
Assignee:
SanDisk Technologies LLC, Plano, TX (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 12/02 (2006.01); G06F 3/06 (2006.01); G06F 11/08 (2006.01); G11C 16/34 (2006.01); G11C 29/00 (2006.01); G11C 29/44 (2006.01); G11C 29/52 (2006.01); G11C 11/56 (2006.01);
U.S. Cl.
CPC ...
G06F 3/0631 (2013.01); G06F 3/064 (2013.01); G06F 3/0616 (2013.01); G06F 3/0679 (2013.01); G06F 11/08 (2013.01); G11C 16/349 (2013.01); G11C 29/00 (2013.01); G11C 29/4401 (2013.01); G11C 29/52 (2013.01); G11C 29/76 (2013.01); G11C 11/5642 (2013.01);
Abstract
An individual block health metric value calculated for each of a plurality of blocks from a combination of factors including at least program-erase cycle count and error rate is used to order the plurality of blocks in order of block health metric values in an ordered list. Subsequently, a block may be selected for use according to a position of the block in the ordered list.