The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 01, 2018

Filed:

Sep. 20, 2016
Applicant:

Applied Materials Israel Ltd., Rehovot, IL;

Inventors:

Ron Naftail, Shoham, IL;

Boris Golberg, Ashdod, IL;

Rami Elichai, Ashkelon, IL;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 40/14 (2006.01); G02B 26/10 (2006.01); G02B 27/09 (2006.01); G01N 21/95 (2006.01); G01N 21/88 (2006.01);
U.S. Cl.
CPC ...
G02B 26/10 (2013.01); G01N 21/8806 (2013.01); G01N 21/9501 (2013.01); G02B 27/0966 (2013.01); G01N 2201/105 (2013.01);
Abstract

A scanning system that includes an illumination module that is configured to scan, at a first direction, an elongated radiation spot over an object; and a collection module that is configured to (a) collect a collected radiation beam from the object, and (b) optically manipulate the collected radiation beam to provide a counter-scan beam is directed towards a set of detection units and has a focal point that is positioned at a same location regardless of the propagation of the elongated radiation spot along the first direction.


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