The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 01, 2018

Filed:

Jul. 25, 2014
Applicant:

Hitachi High-technologies Corporation, Tokyo, JP;

Inventors:

Yoshihiro Yamashita, Tokyo, JP;

Toshiharu Suzuki, Tokyo, JP;

Takaaki Hagiwara, Tokyo, JP;

Kazunori Yamazawa, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 35/00 (2006.01); G01N 21/00 (2006.01); G01N 1/00 (2006.01); G01N 15/00 (2006.01); G01N 33/00 (2006.01); G01N 33/48 (2006.01); G01N 31/00 (2006.01);
U.S. Cl.
CPC ...
G01N 35/0092 (2013.01); G01N 35/00712 (2013.01); G01N 35/00871 (2013.01); G01N 2035/0091 (2013.01); G01N 2035/0094 (2013.01); G01N 2035/00643 (2013.01); G01N 2035/00673 (2013.01);
Abstract

The present invention provides an automatic analyzer capable of reducing the time necessary for analysis processing by making various operations pertaining to the analysis processing more efficient. More specifically, the present invention is characterized in that, from among a plurality of ending operation items set as analysis ending operations to perform at the end of analysis operations for analyzing a sample under analysis, one or more ending operation items to be performed are selected, and on the basis of monitoring results of monitoring the status of an automatic analyzer during the period from the end of the analysis ending operations to the start of analysis preparation operations for preparing for the analysis operations, one or more preparation operation items to be performed are selected from among a plurality of preparation operation items set as analysis preparation operations.


Find Patent Forward Citations

Loading…