The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 24, 2018

Filed:

Jun. 21, 2017
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, Gyeonggi-do, KR;

Inventors:

Hyun-gi Kim, Hwaseong-si, KR;

Sang-moo Jeong, Seoul, KR;

Seon-ju Kim, Suwon-si, KR;

Hye-won Kim, Gimhae-si, KR;

Assignee:

SAMSUNG ELECTRONICS CO., LTD., Suwon-Si, Gyeonggi-Do, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 27/108 (2006.01); H01L 21/306 (2006.01); H01L 21/311 (2006.01); H01L 21/3105 (2006.01); H01L 21/3213 (2006.01); H01L 21/768 (2006.01);
U.S. Cl.
CPC ...
H01L 27/10891 (2013.01); H01L 21/30604 (2013.01); H01L 21/31051 (2013.01); H01L 21/31111 (2013.01); H01L 21/32133 (2013.01); H01L 21/32139 (2013.01); H01L 21/76895 (2013.01); H01L 21/76897 (2013.01); H01L 27/10814 (2013.01); H01L 27/10823 (2013.01); H01L 27/10885 (2013.01); H01L 27/10888 (2013.01);
Abstract

A method of manufacturing an integrated circuit device includes forming multilayered stack structures that extend parallel to and separated from one another on a substrate, followed by forming a buried conductive layer including a plurality of conductive line patterns that extend parallel to an extending direction of the multilayered stack structures and alternate with the multilayered stack structures; removing portions of the buried conductive layer to thereby separate the plurality of conductive line patterns of the buried conductive layer from one another as a plurality of contact plugs and, at the same time, form a plurality of insulating fence spaces that alternate with the plurality of contact plugs in the extending direction of the multilayered stack structures; and forming a plurality of insulating fences that fill the plurality of insulating fence spaces and include a plurality of insulating line patterns extending parallel to one another.


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