The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 24, 2018

Filed:

Feb. 21, 2013
Applicant:

Advantest Corporation, Tokyo, JP;

Inventors:

Jonh Frediani, Corralitos, CA (US);

Andrew Niemic, Mountain View, CA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 27/28 (2006.01); G01R 31/00 (2006.01); G01R 31/14 (2006.01); G01L 15/00 (2006.01); G01R 31/28 (2006.01); G01R 31/3183 (2006.01);
U.S. Cl.
CPC ...
G01R 31/2834 (2013.01); G01R 31/318307 (2013.01);
Abstract

Automated test equipment capable of performing a high-speed test of semiconductor devices is presented. The automated test equipment comprises a system controller for controlling a test program, wherein the system controller is coupled to a bus. The tester system further comprises a plurality of modules also coupled to the bus, where each module is operable to test a plurality of DUTs. Each of the modules comprises a tester processor coupled to the bus and a plurality of configurable blocks communicatively coupled to the tester processor. Each of the configurable blocks is operable to communicate with an associated DUT and further operable to be programmed with a communication protocol for communicating test data to and from said associated device under test.


Find Patent Forward Citations

Loading…