The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 24, 2018
Filed:
Jul. 29, 2013
Hitachi High-technologies Corporation, Tokyo, JP;
Kenichi Yasuzawa, Tokyo, JP;
Kenichi Takahashi, Tokyo, JP;
Koji Kamoshida, Tokyo, JP;
Masashi Akutsu, Tokyo, JP;
Shigeru Yano, Tokyo, JP;
Hitachi High-Technologies Corporation, Tokyo, JP;
Abstract
The invention provides a sample inspection automation system capable of easily, reliably, and efficiently responding to requests for reinspection or addition of inspection items. The sample inspection automation system includes a storage unit having a sample replacing mechanism for transferring a sample from a tray to a sample transfer line. When the system receives sample retrieval information through the communication between an operating unit and a laboratory information system (LIS), or a host system of the sample inspection automation system, the sample is transferred to the appropriate sample treatment unit through the transfer line. Thus, when a request for reinspection or an addition inspection is issued, the sample inspection automation system can efficiently respond to it.