The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 17, 2018
Filed:
Mar. 10, 2016
Intel Corporation, Santa Clara, CA (US);
Rolf H. Kuehnis, Portland, OR (US);
Patrik Eder, Taufkirchen, DE;
Intel Corporation, Santa Clara, CA (US);
Abstract
Embodiments of the present disclosure provide a method and apparatus for device testing via an optical interface. In one instance, the apparatus may comprise a test controller to operate a camera to generate an image to capture test data displayed on a screen of a device under test. The test controller may be configured to extract the test data from the image, analyze the test data, and generate feedback information for the device under test, based at least in part on a result of the analysis of the test data. The camera may be included in the apparatus and communicatively coupled with the test controller. Other embodiments may be described and/or claimed.