The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 17, 2018
Filed:
Apr. 18, 2016
Applicant:
Intel Corporation, Santa Clara, CA (US);
Inventors:
Marian Rudolf, Montreal, CA;
Stephen G. Dick, Nesconset, NY (US);
Teresa Joanne Hunkeler, Montreal, CA;
Shamim Akbar Rahman, Montreal, CA;
Assignee:
INTEL CORPORATION, Santa Clara, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04W 52/00 (2009.01); H04L 12/24 (2006.01); H04W 52/54 (2009.01); H04W 24/10 (2009.01); H04W 52/24 (2009.01); H04W 24/04 (2009.01); H04W 24/00 (2009.01); H04B 17/24 (2015.01); H04W 84/12 (2009.01);
U.S. Cl.
CPC ...
H04L 41/0213 (2013.01); H04L 41/00 (2013.01); H04W 24/04 (2013.01); H04W 24/10 (2013.01); H04W 52/24 (2013.01); H04W 52/54 (2013.01); H04B 17/24 (2015.01); H04L 41/042 (2013.01); H04W 24/00 (2013.01); H04W 84/12 (2013.01);
Abstract
A method and apparatus may be used for exchanging measurements in wireless communications. The apparatus may receive a request. The request may be a measurement request, and may include a request for a measurement of a parameter. The apparatus may transmit a report. The report may be a measurement report, and may include the requested measurement of a parameter. The apparatus may store the requested measurement of the parameter in a management information base (MIB).