The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 17, 2018
Filed:
Nov. 21, 2013
International Business Machines Corporation, Armonk, NY (US);
Charles J. Alpert, Austin, TX (US);
Zhuo Li, Cedar Park, TX (US);
Sani R. Nassif, Austin, TX (US);
Yilin Zhang, Austin, TX (US);
Ying Zhou, Cedar Park, TX (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A slew-based effective capacitance (C) is used to compute gate output slew during early synthesis of an integrated circuit design. A π model is constructed for the gate and reduced to two parameters which are used to compute a slew value for the model, given a slew definition. A capacitance coefficient is then calculated as a function of this slew value. The effective capacitance is the product of the coefficient and the total capacitance of the π model. The output slew of the gate may in turn be computed using the slew-based C. The coefficient may be computed by iteratively solving an equation representing output voltage over time dependent on the first and second parameters, by directly solving a closed-form equation which is a function of the first and second parameters, or by looking up the capacitance coefficient in a table indexed by the first and second parameters.