The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 10, 2018
Filed:
Aug. 07, 2015
Applicant:
The Charles Stark Draper Laboratory, Inc., Cambridge, MA (US);
Inventor:
Maurice S. Karpman, Brookline, MA (US);
Assignee:
THE CHARLES STARK DRAPER LABORATORY, INC., Cambridge, MA (US);
Primary Examiner:
Int. Cl.
CPC ...
G01B 7/16 (2006.01); H01L 23/00 (2006.01); G01L 1/18 (2006.01); G01L 1/06 (2006.01);
U.S. Cl.
CPC ...
H01L 23/576 (2013.01); G01L 1/06 (2013.01); G01L 1/18 (2013.01); H01L 2924/0002 (2013.01);
Abstract
Techniques for providing a tamper mechanism for semiconductor devices are disclosed herein. The techniques include, for example, providing at least one die and at least one strain gauge, orienting the at least one strain gauge to the die, forming an encapsulated semiconductor device by encapsulating the die and each strain gauge within a mold compound to maintain respective orientation, and measuring an initial strain value for the at least one strain gauge after forming the encapsulated semiconductor device.