The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 03, 2018
Filed:
Jun. 20, 2012
Shunpei Yamazaki, Setagaya, JP;
Masayuki Sakakura, Tochigi, JP;
Ryosuke Watanabe, Ebina, JP;
Junichiro Sakata, Atsugi, JP;
Kengo Akimoto, Atsugi, JP;
Akiharu Miyanaga, Hadano, JP;
Takuya Hirohashi, Atsugi, JP;
Hideyuki Kishida, Atsugi, JP;
Shunpei Yamazaki, Setagaya, JP;
Masayuki Sakakura, Tochigi, JP;
Ryosuke Watanabe, Ebina, JP;
Junichiro Sakata, Atsugi, JP;
Kengo Akimoto, Atsugi, JP;
Akiharu Miyanaga, Hadano, JP;
Takuya Hirohashi, Atsugi, JP;
Hideyuki Kishida, Atsugi, JP;
SEMICONDUCTOR ENERGY LABORATORY CO., LTD., Kanagawa-ken, JP;
Abstract
To provide a transistor having a favorable electric characteristics and high reliability and a display device including the transistor. The transistor is a bottom-gate transistor formed using an oxide semiconductor for a channel region. An oxide semiconductor layer subjected to dehydration or dehydrogenation through heat treatment is used as an active layer. The active layer includes a first region of a superficial portion microcrystallized and a second region of the rest portion. By using the oxide semiconductor layer having such a structure, a change to an n-type, which is attributed to entry of moisture to the superficial portion or elimination of oxygen from the superficial portion, and generation of a parasitic channel can be suppressed. In addition, contact resistance between the oxide semiconductor layer and source and drain electrodes can be reduced.