The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 03, 2018

Filed:

Dec. 09, 2016
Applicant:

Nxp Usa, Inc., Austin, TX (US);

Inventors:

Song Huang, Suzhou, CN;

Yifeng Liu, Suzhou, CN;

Lei Ji, Suzhou, CN;

Assignee:

NXP USA, Inc., Austin, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01);
U.S. Cl.
CPC ...
G06F 17/504 (2013.01);
Abstract

Embodiments provided herein include a method for a clock gating verification during a register transfer level (RTL) circuit design stage, including: obtaining clock gating information defined in a clock gating (CG) specification according to a clock gating format, wherein the clock gating information describes a target clock gating behavior of at least a first gated clock signal utilized by an integrated circuit design, the CG specification comprises a template structure defining a relationship between an output gated clock and an input clock, based on an enable condition, and a top mapping associating top level signals, including the first gated clock signal, of the integrated circuit design to the template structure; and automatically generating a first clock gating (CG) checker to verify a clock gating behavior, based on an expected output time and an expected gated time during testing of the integrated circuit design.


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