The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 27, 2018

Filed:

Dec. 22, 2016
Applicant:

Hitachi Kokusai Electric Inc., Tokyo, JP;

Inventors:

Satoshi Shimamoto, Toyama, JP;

Teruo Yoshino, Toyama, JP;

Tadashi Terasaki, Toyama, JP;

Masanori Nakayama, Toyama, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/02 (2006.01); C23C 16/455 (2006.01); C23C 16/50 (2006.01); C23C 16/40 (2006.01);
U.S. Cl.
CPC ...
H01L 21/02164 (2013.01); C23C 16/401 (2013.01); C23C 16/455 (2013.01); C23C 16/50 (2013.01); H01L 21/02274 (2013.01);
Abstract

Disclosed is a method of manufacturing a semiconductor device. The method includes: (a) accommodating a substrate having a plurality of carbon-containing films protruding from a surface of the substrate; (b) forming a silicon-containing film on a surface of the plurality of carbon-containing films and a surface of the substrate by supplying a silicon-containing gas to the substrate; (c) forming a silicon/oxygen-containing film by supplying a first plasma of an oxygen-containing gas to the substrate; and (d) forming a silicon oxide film by supplying a second plasma of the oxygen-containing gas to the substrate after performing (c).

Published as:
US9929005B1; US2018090310A1; CN107871652A; KR20180034167A; JP2018056173A; TW201822256A; TWI647745B; JP6456893B2; KR101965145B1; CN107871652B;

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