The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 27, 2018

Filed:

Mar. 18, 2016
Applicant:

Fujifilm Corporation, Tokyo, JP;

Inventors:

Kiyofumi Yamamoto, Saitama, JP;

Tatsuya Fujinami, Saitama, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 5/225 (2006.01); G02B 7/02 (2006.01); H04N 5/232 (2006.01); H04N 17/00 (2006.01);
U.S. Cl.
CPC ...
G02B 7/02 (2013.01); H04N 5/225 (2013.01); H04N 5/2253 (2013.01); H04N 5/2257 (2013.01); H04N 5/232 (2013.01); H04N 5/23212 (2013.01); H04N 17/002 (2013.01); Y10T 29/4978 (2015.01); Y10T 29/49771 (2015.01); Y10T 29/49778 (2015.01);
Abstract

The present invention provides an imaging module manufacturing method capable of performing positioning of an imaging element unit and a lens unit with high accuracy and provides an imaging module manufacturing device. In a manufacturing device (), in a state where a top surface () of a housing () of a lens unit () is adsorbed to an adsorption surface () of an adsorption head () so as to hold the lens unit () on a Z axis and an imaging element unit () is held on the Z axis, a Z axis direction position of the imaging element unit () with respect to the lens unit () is changed, a measurement chart () is imaged by the imaging element (), and a position and an inclination of the imaging element unit () with respect to the lens unit () are adjusted based on imaging signals obtained by the imaging.


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