The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 27, 2018

Filed:

Sep. 01, 2015
Applicant:

Disco Corporation, Tokyo, JP;

Inventors:

Tsutomu Maeda, Tokyo, JP;

Kiyoshi Ohsuga, Tokyo, JP;

Assignee:

Disco Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B23K 26/03 (2006.01); H01L 21/68 (2006.01); B23K 26/00 (2014.01); B23K 26/53 (2014.01); H01L 21/67 (2006.01); B23K 26/402 (2014.01); B23K 103/00 (2006.01);
U.S. Cl.
CPC ...
B23K 26/0057 (2013.01); B23K 26/032 (2013.01); B23K 26/402 (2013.01); B23K 26/53 (2015.10); H01L 21/67092 (2013.01); H01L 21/681 (2013.01); B23K 2203/56 (2015.10);
Abstract

A laser processing apparatus is provided wherein a laser beam of a wavelength which passes through a wafer having a surface on which a plurality of devices are disposed is irradiated along a schedule division line to separate the adjacent devices from each other to form a modification layer which continuously extends in a given length in the inside of the wafer. A mark portion is displayed in an overlapping relationship with a picked up image obtained by image pickup of a wafer on a display unit. If the mark portion is moved to a desired position of the picked up image displayed on the display unit, then coordinates which correspond to the desired position of the picked up image are stored as a start point or an end portion of a scheduled division line, along which the modification layer is to be formed, into a storage unit.


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