The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 13, 2018
Filed:
Mar. 30, 2016
Intel Corporation, Santa Clara, CA (US);
Tal Azogui, Petach Tikva, IL;
Vered Bar Bracha, Hod Hasharon, IL;
Vallabhajosyula S. Somayazulu, Portland, OR (US);
Wei Wu, Portland, OR (US);
INTEL CORPORATION, Santa Clara, CA (US);
Abstract
Provided are a method and apparatus for an error tolerance aware data retention scheme in a storage device for multi-scale error tolerant data. A mapping of retention priorities to sectors of the storage units maps higher retention priorities to sectors having a higher retention capability. A data stream and retention metadata for the data stream indicate retention priorities for segments of the data stream. Segments of the data stream having less error tolerance are mapped to higher retention priorities than segments of the data stream having greater error tolerance. The mapping of retention priorities is used to determine a sector having a retention priority matching a retention priority of a segment of the data stream indicated in the retention metadata. The segment of the data stream is stored in the determined sector.