The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 06, 2018

Filed:

Jan. 29, 2015
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Taryn J. Davis, Beacon, NY (US);

Tuhin Sinha, Hackensack, NJ (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 25/065 (2006.01); H01L 29/06 (2006.01); H01L 23/42 (2006.01); H01L 23/367 (2006.01); H01L 21/56 (2006.01); H01L 25/00 (2006.01); H01L 23/498 (2006.01); H01L 23/10 (2006.01); H01L 23/04 (2006.01);
U.S. Cl.
CPC ...
H01L 25/0655 (2013.01); H01L 21/563 (2013.01); H01L 23/3675 (2013.01); H01L 23/42 (2013.01); H01L 25/50 (2013.01); H01L 29/0657 (2013.01); H01L 23/04 (2013.01); H01L 23/10 (2013.01); H01L 23/49816 (2013.01); H01L 2224/16225 (2013.01); H01L 2224/73204 (2013.01); H01L 2224/73253 (2013.01); H01L 2924/15311 (2013.01); H01L 2924/16152 (2013.01);
Abstract

A lidded or lidless flip-chip package includes two or more polygon shaped dies. The polygon dies may be interconnected to a substrate or to an interposer interconnected to a substrate. The interposer may be similarly shaped with respect to the polygon die(s). For the lidless or lidded package, the package may include underfill under the polygon dies surrounding associated interconnects. For the lidded package, the package may also include thermal interface materials, seal bands, and a lid. The polygon die package reduces shear stress between the polygon die/interposer and associated underfill as compared to square or rectangular shaped die/interposer of the same area. The polygon dies further maximize the utilization of a wafer from upon which the polygon dies are fabricated. The multi polygon die package may allow for a significant reduction of the polygon die to polygon die relative to the spacing and may reduce signal interconnect time.


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