The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 06, 2018

Filed:

Dec. 14, 2016
Applicant:

Taiwan Semiconductor Manufacturing Co., Ltd., Hsinchu, TW;

Inventors:

Zhi-Sheng Zheng, New Taipei, TW;

Chih-Lin Wang, Hsinchu County, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 23/48 (2006.01); H01L 23/522 (2006.01); H01L 21/768 (2006.01); H01L 23/532 (2006.01); H01L 23/528 (2006.01);
U.S. Cl.
CPC ...
H01L 23/5226 (2013.01); H01L 21/76802 (2013.01); H01L 21/76834 (2013.01); H01L 21/76883 (2013.01); H01L 21/76885 (2013.01); H01L 23/5283 (2013.01); H01L 23/5329 (2013.01); H01L 2924/0002 (2013.01);
Abstract

An interconnection structure includes a first dielectric layer, at least one first conductor, and an etch stop layer. The first conductor is disposed partially in the first dielectric layer and has a portion protruding from the first dielectric layer. The etch stop layer is disposed on the first dielectric layer and covers the protruding portion of the first conductor. The etch stop layer has a cap portion on a top surface of the protruding portion of the first conductor and a spacer portion on at least one sidewall of the protruding portion of the first conductor, and the spacer portion is thicker than the cap portion.


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