The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 27, 2018

Filed:

Jan. 09, 2013
Applicants:

Michael Priel, Netanya, IL;

Leonid Fleshel, Hertzelia, IL;

Roman Mostinski, Jerusalem, IL;

Vladimir Nusimovich, Hertzelia, IL;

Inventors:

Michael Priel, Netanya, IL;

Leonid Fleshel, Hertzelia, IL;

Roman Mostinski, Jerusalem, IL;

Vladimir Nusimovich, Hertzelia, IL;

Assignee:

NXP USA, Inc., Austin, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 7/00 (2006.01); G11C 19/00 (2006.01); G01R 31/317 (2006.01); G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
H04L 7/00 (2013.01); G01R 31/2837 (2013.01); G01R 31/2884 (2013.01); G01R 31/31712 (2013.01); G11C 19/00 (2013.01);
Abstract

There is provided a method, apparatus and integrated circuit for measuring a signal, the apparatus comprising a plurality of sample stages arranged in series, each sample stage comprising a delay element, and a sample element, wherein an input of the sample element is coupled to an output of the delay element, and a strobe line for controlling a sample time of the sample elements, the strobe line comprising a plurality of strobe delay elements arranged in series, wherein an output of each strobe delay element is coupled to one or more sample elements.


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