The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 20, 2018
Filed:
Feb. 24, 2015
Intel Corporation, Santa Clara, CA (US);
Tao Ma, Cincinnati, OH (US);
Yi Wu, San Jose, CA (US);
Oscar Nestares, San Jose, CA (US);
Kalpana Seshadrinathan, Santa Clara, CA (US);
Wei Sun, San Jose, CA (US);
Intel Corporation, Santa Clara, CA (US);
Abstract
Techniques for improved image disparity estimation are described. In one embodiment, for example, an apparatus may comprise a processor circuit and an imaging management module, and the imaging management module may be operable by the processor circuit to determine a measured horizontal disparity factor and a measured vertical disparity factor for a rectified image array, determine a composite horizontal disparity factor for the rectified image array based on the measured horizontal disparity factor and an implied horizontal disparity factor, and determine a composite vertical disparity factor for the rectified image array based on the measured vertical disparity factor and an implied vertical disparity factor. Other embodiments are described and claimed.