The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 20, 2018

Filed:

Feb. 23, 2017
Applicant:

Omron Corporation, Kyoto-shi, Kyoto, JP;

Inventors:

Hidekatsu Nogami, Kusatsu, JP;

Yoshimitsu Nakano, Ritto, JP;

Tomohiro Nishimura, Otsu, JP;

Assignee:

OMRON Corporation, Kyoto-shi, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 7/10 (2006.01); G06K 19/077 (2006.01); G06K 7/00 (2006.01);
U.S. Cl.
CPC ...
G06K 7/10138 (2013.01); G06K 7/0008 (2013.01); G06K 7/10009 (2013.01); G06K 7/10435 (2013.01); G06K 19/07758 (2013.01);
Abstract

A controller in an interrogation device performs, for each RF tag passing through an interrogation zone that is defined near an interrogation unit, an integration process of integrating a strength of a reception signal from the RF tag received by the interrogation unit. The integration process includes weighting of an integral value of the strength of the reception signal in a manner to cause an integrate value calculated for each reception signal to be larger than an integral value calculated for a preceding reception signal. When an RF tag moves to a predetermined position in the interrogation zone, the controller transmits, to a host device, an identifier of an RF tag having a maximum integral value selected from the integrated value calculated for each RF tag.


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