The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 20, 2018
Filed:
Oct. 15, 2013
Brian C. Kahne, Austin, TX (US);
John H. Arends, Austin, TX (US);
Richard G. Collins, Austin, TX (US);
James C. Holt, Austin, TX (US);
Brian C. Kahne, Austin, TX (US);
John H. Arends, Austin, TX (US);
Richard G. Collins, Austin, TX (US);
James C. Holt, Austin, TX (US);
NXP USA, INC., Austin, TX (US);
Abstract
An approach is provided in which an endianness violation detection sub-system detects endianness violations between hardware units. The endianness violation detection sub-system tracks memory operations performed by multiple hardware units via debug channels and generates lookup table entries that are stored in a lookup table. When the endianness violation detection sub-system detects endianness relevant load attributes of a load operation that are different than corresponding endianness relevant store attributes of a store operation, the endianness violation detection sub-system generates an endianness violation. In one embodiment, the endianness violation detection sub-system identifies an endianness violation when the endianness violation detection sub-system detects a difference in the byte ordering type between a hardware unit performing a store operation and a hardware unit performing a load operation.