The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 20, 2018

Filed:

Apr. 03, 2017
Applicant:

Nxp Usa, Inc., Austin, TX (US);

Inventors:

Didier Salle, Toulouse, FR;

Olivier Doare, La Salvetat St Gilles, FR;

Cristian Pavao Moreira, Frouzins, FR;

Birama Goumballa, Larra, FR;

Assignee:

NXP USA, INC., Austin, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03M 1/10 (2006.01); G04F 10/00 (2006.01);
U.S. Cl.
CPC ...
G04F 10/005 (2013.01); H03M 1/1009 (2013.01);
Abstract

Various embodiments include a time to digital converter device comprising: a medium resolution delay unit including a plurality of buffers, the medium resolution delay unit configured to receive as inputs a reference clock signal and a data clock signal and configured to output a plurality of delayed data clock signals wherein the delay between the plurality of delayed data clock signal is a medium resolution delay value; a fine resolution delay unit including a plurality of cores configured to receive as inputs the reference clock signal and the plurality of delayed data clock signals from the medium resolution delay unit, wherein the plurality of cores includes: a first bank of delays configured to receive one of the plurality of the delayed data clock signals, a second bank of delays configured to receive the reference clock signal, and; and a fast flip flop connected to the outputs of the first bank of delays and the second bank of delays, wherein the output of the fast flip flop is used to check the phase alignment.


Find Patent Forward Citations

Loading…