The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 20, 2018
Filed:
Jun. 20, 2013
Hitachi High-technologies Corporation, Tokyo, JP;
Hideto Tamezane, Tokyo, JP;
Isao Yamazaki, Tokyo, JP;
Masaharu Nishida, Tokyo, JP;
Kumiko Kamihara, Tokyo, JP;
Hitachi High-Technologies Corporation, Tokyo, JP;
Abstract
An automatic analyzer that accurately detects dispensation abnormality in dispensation conditions with small suction quantities has a statistical distance calculation unit that calculates characteristic variables regarding a sucking operation in the first dispensation and calculates a statistical distance D from reference data to the characteristic variables extracted from a memory. A comparison unit compares the statistical distance D with a preset threshold value stored in memory and if the statistical distance D is less than the preset threshold value, the first discharging operation is performed. A controller judges whether a single-handed judgment based on a dispensation quantity condition of the second or subsequent dispensation is possible or not. If the single-handed judgment is impossible, reference data is selected based on a judgment quantity regarding the first dispensation. Whether the sucking operation in the second or subsequent dispensation is normal or abnormal is judged based on the selected reference data.