The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 13, 2018

Filed:

Aug. 17, 2015
Applicant:

Rambus Inc., Sunnyvale, CA (US);

Inventors:

Craig M. Smith, Spencerport, NY (US);

Michael Guidash, Rochester, NY (US);

Thomas Vogelsang, Mountain View, CA (US);

Jay Endsley, San Jose, CA (US);

Michael T. Ching, Los Altos, CA (US);

Assignee:

Rambus Inc., Sunnyvale, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 5/374 (2011.01); H04N 5/369 (2011.01);
U.S. Cl.
CPC ...
H04N 5/3742 (2013.01); H04N 5/3692 (2013.01);
Abstract

Photocharge is integrated within a first plurality of pixels of an integrated-circuit image sensor during a first exposure interval. A read-out signal is output from each pixel of the first plurality of pixels upon conclusion of the first exposure interval, each read-out signal indicating a respective level of photocharge integrated within the corresponding pixel during the first exposure interval. Photocharge is also integrated within a second plurality of pixels during a second exposure interval that transpires concurrently with the first exposure interval and has a duration not more than half the duration of the first exposure interval. A read-out signal is output from each pixel of the second plurality of pixels at least twice with respect to the second exposure interval, with each such read-out signal indicating a respective level of photocharge integrated within the corresponding pixel during at least a portion of the second exposure interval.


Find Patent Forward Citations

Loading…