The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 13, 2018

Filed:

Feb. 01, 2017
Applicant:

Intel Corporation, Santa Clara, CA (US);

Inventor:

Helia A. Naeimi, Santa Clara, CA (US);

Assignee:

Intel Corporation, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 11/00 (2006.01); G11C 11/16 (2006.01); G06F 12/0897 (2016.01);
U.S. Cl.
CPC ...
G11C 11/1673 (2013.01); G06F 12/0897 (2013.01); G11C 11/1675 (2013.01); G06F 2212/222 (2013.01);
Abstract

Systems, apparatuses and methods may provide for detecting a read-write condition in which a read operation from a location in magnetoresistive memory such as spin transfer torque (STT) memory is to be followed by a write operation to the location. Additionally, a current level associated with the read operation may be increased, wherein the read operation is conducted from the location at the increased current level. In one example, the increased current level causes a reset of all bits in the location.


Find Patent Forward Citations

Naeimi, Helia. (2018). Destructive reads from spin transfer torque memory under read-write conditions (U.S. Patent No. 9892775). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9892775

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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