The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 13, 2018
Filed:
Feb. 09, 2015
Carl Zeiss Microscopy Gmbh, Jena, DE;
Thorsten Kues, Bovenden-Eddigehausen, DE;
Ralf Steinmeyer, Hannover, DE;
Carl Zeiss Microscopy GmbH, Jena, DE;
Abstract
A procedure for the correction of spherical aberration in microscopic applications, wherein various recordings of a specimen to be observed are taken and evaluated for the purpose of changing the setting values of the optical system. The correction values are stored in a correction matrix as a function of the recording position, the recording time, the wavelength, and the temperature, wherein the determination and storage of the correction values are carried out in each recording position in the x, y, and z coordinates, and/or the correction values are determined after a selection of grid points by interpolation, so that the correction values of the interpolated correction matrix are the starting values for the subsequent exact determination by measurement.