The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 13, 2018
Filed:
Nov. 30, 2015
Applicant:
Cadence Design Systems, Inc., San Jose, CA (US);
Inventors:
Assignee:
Cadence Design Systems, Inc., San Jose, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01); G01R 31/00 (2006.01); G01R 31/3177 (2006.01); G01R 31/26 (2014.01); G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
G01R 31/3177 (2013.01); G06F 17/5009 (2013.01); G06F 17/5081 (2013.01); G01R 31/26 (2013.01); G01R 31/2803 (2013.01); G06F 17/504 (2013.01);
Abstract
A method includes receiving from a user, via a user interface, coverage-event characteristics. Using a processor, output data of test runs executed on a device-under-test is analyzed to identify one or a plurality of coverage events that possess the coverage-event characteristics and to identify one or a plurality of contributing test runs in said test runs that contributed to said one or a plurality of coverage events. Information on said one or a plurality of contributing test runs is outputted via an output device.