The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 30, 2018

Filed:

Feb. 07, 2015
Applicant:

Hitachi Metals, Ltd., Tokyo, JP;

Inventors:

Kazufumi Suenaga, Tsuchiura, JP;

Kenji Shibata, Tsukuba, JP;

Kazutoshi Watanabe, Tsuchiura, JP;

Fumimasa Horikiri, Nagareyama, JP;

Masaki Noguchi, Tsuchiura, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 41/187 (2006.01); H03H 9/17 (2006.01); H03H 9/02 (2006.01); H03H 9/15 (2006.01);
U.S. Cl.
CPC ...
H03H 9/171 (2013.01); H03H 9/02015 (2013.01); H03H 2009/155 (2013.01); Y10T 29/42 (2015.01);
Abstract

An alkali-niobate-based piezoelectric thin film element includes a substrate, a lower electrode film on the substrate, a piezoelectric thin film on the lower electrode film, and an upper electrode film on the piezoelectric thin film. The piezoelectric thin film is made of an alkali-niobate-based piezoelectric material represented by the formula (NaKLi)NbO, where 0≦x≦1, 0≦y≦1, 0≦z≦0.2, and x+y+z=1. The piezoelectric thin film has an element pattern and contains a metal element in a higher concentration near the upper electrode film than near the lower electrode film. The average concentration of the metal element is 5×10atoms/cmor less in a region within ±15% of the thickness of the piezoelectric thin film from a position corresponding to half the thickness of the piezoelectric thin film.


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