Wimpy and nominal semiconductor device structures for vertical finfets

Abstract

A first and second vertical fin are formed on a substrate structure. A dielectric layer is disposed on the substrate structure and the first and second vertical fins. A work function metal (WFM) layer is disposed on the dielectric layer. A first sidewall spacer and a second sidewall space are formed proximate to the first vertical fin and the second vertical fin, respectively. A lithographic mask is applied to a first area proximate to the first vertical fin including the first vertical fin, and a portion of the WFM layer proximate to the first vertical fin. A portion of the WFM layer proximate to the second sidewall spacer is recessed below an upper surface of the second sidewall spacer. The lithographic mask is removed. A portion of the dielectric layer is removed to produce a wimpy vertical transport device and a nominal vertical transport device on the substrate structure.