The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 30, 2018

Filed:

Oct. 15, 2015
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, Gyeonggi-do, KR;

Inventors:

Jae-hong Kim, Seoul, KR;

Yoshihiko Hayashi, Seongnam-si, KR;

Akinori Okubo, Hwaseong-si, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S 7/52 (2006.01); G01S 15/89 (2006.01); G10K 11/34 (2006.01); G01N 29/06 (2006.01); G01N 29/26 (2006.01); G01S 17/89 (2006.01); G01S 13/89 (2006.01);
U.S. Cl.
CPC ...
G01S 7/5205 (2013.01); G01N 29/0654 (2013.01); G01N 29/262 (2013.01); G01S 7/52025 (2013.01); G01S 7/52047 (2013.01); G01S 7/52077 (2013.01); G01S 15/8915 (2013.01); G01S 15/8925 (2013.01); G01S 15/8929 (2013.01); G10K 11/346 (2013.01); G01N 2291/044 (2013.01); G01S 13/89 (2013.01); G01S 17/89 (2013.01);
Abstract

A test device includes a plurality of transceivers that respectively transmit a wave to a test target point of a test object, respectively receive a wave reflected, scattered, or refracted from the test object, and respectively output a signal generated in response to the received wave; a combiner that combines the plurality of received signals generated by the plurality of transceivers; and a plurality of switches that are opened or closed to transfer the plurality of received signals to the combiner or block the plurality of received signals from being transferred to the combiner.


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