The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 30, 2018
Filed:
Aug. 21, 2014
Applicant:
Teradyne, Inc., North Reading, MA (US);
Inventor:
Valquirio N. Carvalho, Lowell, MA (US);
Assignee:
Teradyne, Inc., North Reading, MA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 1/067 (2006.01); G01R 1/073 (2006.01); G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
G01R 1/06794 (2013.01); G01R 1/07342 (2013.01); G01R 31/2844 (2013.01);
Abstract
A probe for automatic test equipment (ATE) includes: an outer shroud including a course alignment feature configured to receive a target device and to guide the target device into an interior of the outer shroud, where the target device includes exposed electrical leads; and an inner structure that is at least partly inside the outer shroud. The inner structure includes electrical contacts for making an electrical connection to the exposed electrical leads, and also includes a fine alignment feature configured to guide the target device towards the electrical contacts to make the electrical connection.