The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 23, 2018

Filed:

Jun. 30, 2015
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, Gyeonggi-do, KR;

Inventors:

Kyu-Dong Jung, Suwon-si, KR;

Jung-Hwan Kim, Bucheon-si, KR;

Dong-Gil Lee, Seoul, KR;

Tae-Je Cho, Yongin-si, KR;

Kwang-Chul Choi, Suwon-si, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B32B 43/00 (2006.01); H01L 21/67 (2006.01); B32B 38/10 (2006.01); B32B 41/00 (2006.01);
U.S. Cl.
CPC ...
H01L 21/67115 (2013.01); B32B 38/10 (2013.01); B32B 41/00 (2013.01); B32B 43/006 (2013.01); H01L 21/67092 (2013.01); H01L 21/67253 (2013.01); B32B 2250/02 (2013.01); B32B 2310/0843 (2013.01); B32B 2457/14 (2013.01); H01L 2221/68381 (2013.01); H01L 2224/98 (2013.01); Y10T 156/1158 (2015.01); Y10T 156/1917 (2015.01);
Abstract

Provided are an initiator and a method for debonding a wafer supporting system. The initiator for debonding a wafer supporting system includes a rotation chuck having an upper surface on which a wafer supporting system (WSS), which includes a carrier wafer, a device wafer, and a glue layer for bonding the carrier wafer and the device wafer to each other, is seated to rotate the wafer supporting system, a detecting module detecting a height and a thickness of the glue layer and a laser module generating a fracture portion on the glue layer through irradiating a side surface of the glue layer with a laser on the basis of the height and the thickness of the glue layer.


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