The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 23, 2018

Filed:

Dec. 10, 2012
Applicant:

Intel Corporation, Santa Clara, CA (US);

Inventors:

Tao Ma, Cincinnati, OH (US);

Wei Sun, San Jose, CA (US);

Oscar Nestares, San Jose, CA (US);

Kalpana Seshadrinathan, Santa Clara, CA (US);

Dinesh Jayaraman, Austin, TX (US);

Assignee:

INTEL CORPORATION, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 13/02 (2006.01); G06T 7/00 (2017.01); G06T 7/80 (2017.01);
U.S. Cl.
CPC ...
G06T 7/002 (2013.01); G06T 7/85 (2017.01); H04N 13/0242 (2013.01); H04N 13/0246 (2013.01); G06T 2207/10012 (2013.01);
Abstract

Techniques for rectification of camera arrays are described. In one embodiment, for example, an apparatus may comprise a processor circuit and an imaging management module, and the imaging management module may be operable on the processor circuit to determine a composite rotation matrix for a camera array comprising a plurality of cameras, determine a composite intrinsic parameter matrix for the camera array, and compute one or more rectification maps for the camera array based on the composite rotation matrix and the composite intrinsic parameter matrix, each of the one or more rectification maps corresponding to one of the plurality of cameras. Other embodiments are described and claimed.


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