The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 23, 2018

Filed:

Jun. 01, 2015
Applicant:

Nidec-read Corporation, Kyoto, JP;

Inventor:

Munehiro Yamashita, Kyoto, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/14 (2006.01); G01R 31/28 (2006.01); G01R 31/12 (2006.01); G01R 27/26 (2006.01); G01R 31/02 (2006.01); H04L 12/24 (2006.01);
U.S. Cl.
CPC ...
G01R 31/1272 (2013.01); G01R 27/2617 (2013.01); G01R 31/28 (2013.01); G01R 31/2812 (2013.01); G01R 31/021 (2013.01); G01R 31/12 (2013.01); H04L 41/0677 (2013.01);
Abstract

A circuit board inspecting apparatus is disclosed for inspecting a circuit board having wiring patterns separated from each other and forming a plurality of wiring pattern pairs. The apparatus includes a low-voltage inspection part to apply a first low-potential difference below a threshold voltage between wiring patterns in a first of the plurality of wiring pattern pairs, and to detect a first current flowing therebetween. A resistance measurement part is provided to measure a first resistance value between the wiring patterns of the first wiring pattern pair upon detection of the first current and a high-voltage inspection part is configured to selectively apply, based on the first resistance value, a high-potential difference above said threshold voltage, between the wiring patterns in a second of said plurality of wiring pattern pairs.


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