The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 23, 2018

Filed:

Dec. 11, 2015
Applicant:

Asm Ip Holding B.v., Almere, NL;

Inventors:

Christophe Pomarede, Vaterstetten, DE;

Eric Shero, Phoenix, AZ (US);

Mohith Verghese, Phoenix, AZ (US);

Jan Willem Maes, Leuven, BG;

Chang-Gong Wang, Chandler, AZ (US);

Assignee:

ASM IP Holding B.V., Almere, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C23C 16/00 (2006.01); C23C 16/455 (2006.01); C23C 16/448 (2006.01); C23C 16/52 (2006.01); H01J 37/32 (2006.01); H01L 21/314 (2006.01); H01L 21/316 (2006.01); C23C 16/04 (2006.01); H01L 21/02 (2006.01); H01L 27/108 (2006.01); C23C 14/24 (2006.01); H01L 21/28 (2006.01);
U.S. Cl.
CPC ...
C23C 16/45525 (2013.01); C23C 16/045 (2013.01); C23C 16/448 (2013.01); C23C 16/4482 (2013.01); C23C 16/45527 (2013.01); C23C 16/45561 (2013.01); C23C 16/52 (2013.01); H01J 37/32449 (2013.01); H01L 21/0228 (2013.01); H01L 21/02148 (2013.01); H01L 21/02172 (2013.01); H01L 21/02181 (2013.01); H01L 21/3142 (2013.01); H01L 21/31645 (2013.01); H01L 27/10861 (2013.01); C23C 14/246 (2013.01); C23C 16/4485 (2013.01); C23C 16/4486 (2013.01); F17C 2205/0142 (2013.01); F17C 2205/0146 (2013.01); F17C 2270/0518 (2013.01); H01L 21/28194 (2013.01);
Abstract

Methods of vapor deposition include multiple vapor sources. A vapor deposition method includes delivering pulses of a vapor containing a first source chemical to a reaction space from at least two separate source vessels simultaneously. The pulses can contain a substantially consistent concentration of the first source chemical. The method can include purging the reaction space of an excess of the first source chemical after the delivering, and delivering pulses of a vapor containing a second source chemical to the reaction space from at least two separate source vessels simultaneously after the purging.


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