The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 16, 2018

Filed:

Sep. 04, 2012
Applicants:

Keisuke Ohta, Fukuoka, JP;

Toshiyuki Kiryu, Gunma, JP;

Inventors:

Keisuke Ohta, Fukuoka, JP;

Toshiyuki Kiryu, Gunma, JP;

Assignee:

KURUME UNIVERSITY, Fukuoka, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 37/26 (2006.01); G01N 23/00 (2006.01); C09D 163/00 (2006.01); G01N 1/36 (2006.01); C08L 63/00 (2006.01); G01N 23/225 (2006.01);
U.S. Cl.
CPC ...
H01J 37/26 (2013.01); C08L 63/00 (2013.01); C09D 163/00 (2013.01); G01N 1/36 (2013.01); G01N 23/00 (2013.01); G01N 23/225 (2013.01);
Abstract

The present invention provides an embedding resin composition for electron microscopy having satisfactory performance as an embedding medium, including embedding performance and sectioning quality, and exhibiting excellent antistatic performance; and a method for observing a sample with an electron microscope using the composition. The embedding resin composition for electron microscopy of the present invention having antistatic performance comprises an ionic liquid and an embedding medium comprising an epoxy-based resin, a methacrylate resin or an unsaturated polyester resin. Preferably, the ionic liquid comprising and


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