The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 09, 2018

Filed:

Dec. 29, 2016
Applicant:

Intel Corporation, Santa Clara, CA (US);

Inventors:

Feng Xue, Redwood City, CA (US);

Yang-Seok Choi, Portland, OR (US);

Shu-Ping Yeh, New Taipei, TW;

Shilpa Talwar, Los Altos, CA (US);

Roya Doostnejad, Los Altos, CA (US);

Assignee:

Intel Corporation, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 1/44 (2006.01); H04B 1/525 (2015.01);
U.S. Cl.
CPC ...
H04B 1/44 (2013.01); H04B 1/525 (2013.01);
Abstract

A method of processing signals may include identifying a plurality of critical elements of a parameter vector based on one or more predefined criteria, wherein the parameter vector represents a relationship between the input signal vector and the output signal vector; identifying a reduced parameter update vector having a plurality of elements, wherein the elements are selected according to a criterion related to the relationship between the input signal vector and the output signal vector; updating the plurality of critical elements of the parameter vector using the reduced parameter update vector to generate an updated parameter vector, wherein the reduced parameter update vector has less elements than the parameter vector; and processing one or more signals associated with the input signal vector using the updated parameter vector.


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