The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 09, 2018
Filed:
Jul. 25, 2016
Applicant:
Fei Company, Hillsboro, OR (US);
Inventor:
Herve-William Remigy, Eindhoven, NL;
Assignee:
FEI Company, Hillsboro, OR (US);
Primary Examiner:
Int. Cl.
CPC ...
H01J 37/00 (2006.01); G01N 1/42 (2006.01); H01J 37/26 (2006.01); H01J 37/20 (2006.01); H01J 37/244 (2006.01); F25B 19/00 (2006.01);
U.S. Cl.
CPC ...
H01J 37/26 (2013.01); F25B 19/005 (2013.01); H01J 37/20 (2013.01); H01J 37/244 (2013.01); H01J 2237/002 (2013.01);
Abstract
A method of preparing a sample for study in a charged-particle microscope, whereby the sample is subjected to rapid cooling using a cryogen, comprising the following steps:
Remigy, Herve-William. (2018). Preparation of cryogenic sample for charged-particle microscopy (U.S. Patent No. 9865428). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9865428
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile