The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 09, 2018

Filed:

Mar. 27, 2015
Applicant:

Intel Corporation, Santa Clara, CA (US);

Inventors:

Justin E. Gottschlich, Santa Clara, CA (US);

Gilles A. Pokam, Fremont, CA (US);

Cristiano L. Pereira, Groveland, CA (US);

Assignee:

Intel Corporation, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/07 (2006.01);
U.S. Cl.
CPC ...
G06F 11/079 (2013.01); G06F 11/073 (2013.01);
Abstract

Technologies for identification of a potential root cause of a use-after-free memory corruption bug of a program include a computing device to replay execution of the execution of the program based on an execution log of the program. The execution log comprises an ordered set of executed instructions of the program that resulted in the use-after-free memory corruption bug. The computing device compares a use-after-free memory address access of the program to a memory address associated with an occurrence of the use-after-free memory corruption bug in response to detecting the use-after-free memory address access and records the use-after-free memory address access of the program as a candidate for a root cause of the use-after-free memory corruption bug to a candidate list in response to detecting a match between the use-after-free memory address access of the program and the memory address associated with the occurrence of the use-after-free memory corruption bug.


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